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来源:雅诚德英语网
The degradations of device output conductance, subthreshold conduction and RF characteristics are also analyzed.
对器件的亚阈区导电和RF等特性的热载流子退化,也作了相应的分析。
The degradations of device output conductance, subthreshold conduction and RF characteristics are also analyzed.
对器件的亚阈区导电和RF等特性的热载流子退化,也作了相应的分析。