This photomicrograph was obtained by scanning a beam of electrons across the sample while a detector kept track of electrons bouncing off its surface, betraying the specimen's outer shape.

这幅显微照片是通过扫描穿过样品的电子束而获得的，同时检测器对从样品表面反弹的电子进行追踪，这些电子显示了标本的外形。